Nearly 60 years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits. \n\nTaking a three-pronged approach-dealing with test engineering from traditional test, design and manufacturing view-points-integrated Circuit Test Engineering encapsulates the subject as it stands today.
Dr. Ian A. Grout is a lecturer within the Department of Electronic and Computer Engineering at the University of Limerick, Ireland. He was born in London, UK in 1967, and earned his Ph.D. from Lancaster University in 1994. He has worked within the microelectronics field for several years, in particular Integrated Circuit test research and education. He has been a lecturer at Limerick since 1998.
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